Quantitative force microscopy from a dynamic point of view

D. B. Haviland

Current Opinion in Colloid & Interface Science 27, 74-81 (2016)−5937

Local Charge Injection and Extraction on Surface-Modified Al2O3 Nanoparticles in LDPE

R. Borgani, L. K. H. Pallon, M. S. Hedenqvist, U. W. Gedde and D. B. Haviland

Nano Lett. 2016, 16, 5934−5937

Probing viscoelastic response of soft material surfaces at the nanoscale

David B. Haviland, Cornelius Anthony van Eysden, Daniel Forchheimer, Daniel Platz, Hailu G. Kassab and Philippe Leclère

Soft Matter 10.1039/c5sm02154e

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Intermodulation electrostatic force microscopy for imaging surface photo-voltage

Riccardo Borgani, Daniel Forchheimer, Jonas Bergqvist, Per-Anders Thorén, Olle Inganäs, and David B. Haviland

Applied Physics Letters 105, 143113 (2014)

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Interaction imaging with amplitude-dependence force spectroscopy

Daniel Platz, Daniel Forchheimer, Erik A. Tholén and David B. Haviland

Nature Communications 4 1360 (2013)

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Model-based extraction of material properties in multifrequency atomic force microscopy

Daniel Forchheimer, Daniel Platz, Erik A. Tholén, and David B. Haviland.

Phys. Rev. B 85, 195449 (2012)

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Simultaneous imaging of surface and magnetic forces

Daniel Forchheimer, Daniel Platz, Erik A. Tholén and David B. Haviland

Appl. Phys. Lett. 103, 013114 (2013)

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This article appeared in Appl. Phys. Lett. 103, 013114 (2013) and may be found at link.aip.org/link/doi/10.1063/1.4812979.
Copyright (2013) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

Improving image contrast and material discrimination with nonlinear response in bimodal atomic force microscopy

Daniel Forchheimer, Robert Forchheimer & David B. Haviland

Nature Communications 6 6270 (2015)

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Determining surface properties with bimodal and multimodal AFM

D Forchheimer, Stanislav S Borysov, D Platz and David B Haviland

Nanotechnology 25 (2014) 485708 (8pp)

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Interpreting motion and force for narrow-band intermodulation atomic force microscopy

Daniel Platz, Daniel Forchheimer, Erik A. Tholén and David B. Haviland

Beilstein Journal of Nanotechnology 2013 4, 45–56

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Polynomial force approximations and multifrequency atomic force microscopy

Daniel Platz, Daniel Forchheimer, Erik A. Tholén and David B. Haviland

Beilstein Journal of Nanotechnology 2013 4, 352–380

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The Intermodulation Lockin Analyzer

Erik A. Tholén, Daniel Platz, Daniel Forchheimer, Vivien Schuler, Mats O. Tholén, Carsten Hutter, David B. Haviland.

Rev. Sci. Instrum. 82, 026109

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This article appeared in Rev. Sci. Instrum. 82, 026109 (2011) and may be found at link.aip.org/link/?RSI/82/026109.
Copyright (2011) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

The role of nonlinear dynamics in quantitative atomic force microscopy

Daniel Platz, Daniel Forchheimer, Erik A Tholén and David B Haviland.

Nanotechnology 23 265705

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Reconstruction of tip-surface interactions with multimodal intermodulation atomic force microscopy

Stanislav S. Borysov, Daniel Platz, Astrid S. de Wijn, Daniel Forchheimer, Eric A. Tolén, Alexander V. Balatsky and David B. Haviland

Phys. Rev. B 88, 115405 (2013)

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Effect of material stiffness on intermodulation response in dynamic atomic force microscopy

Daniel Platz, Daniel Forchheimer, Erik A. Tholén, Carsten Hutter, David B. Haviland

Proceedings of the ASME 2010 International Design Engineering Technical Conferences & Computers and Information in Engineering Conference IDETC/CIE 2010.

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Reconstructing Nonlinearities with Intermodulation Spectroscopy

Carsten Hutter, Daniel Platz, E. A. Tholén, T. H. Hansson, and D. B. Haviland

Phys. Rev. Lett. 104, 050801 (2010)

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DOI: 10.1103/PhysRevLett.104.050801

This article is available under the terms of the Creative Commons Attribution 3.0 License. Further distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation, and DOI.

Phase imaging with intermodulation atomic force microscopy

Daniel Platz, Erik A. Tholén, Carsten Hutter, Arndt C. von Bieren and David B. Haviland

Ultramicroscopy, Volume 110, Issue 6, May 2010, Pages 573-577
11th International Scanning Probe Microscopy Conference

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Intermodulation atomic force microscopy

Daniel Platz, Erik A. Tholén, Devrim Pesen, and David B. Haviland

Appl. Phys. Lett. 92, 153106 (2008)

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This article appeared in Appl. Phys. Lett. 92, 153106 (2008) and may be found at link.aip.org/link/doi/10.1063/1.2909569.
Copyright (2011) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.