References

[Borgani-2014]Intermodulation electrostatic force microscopy for imaging surface photo-voltage Riccardo Borgani, Daniel Forchheimer, Jonas Bergqvist, Per-Anders Thorén, Olle Inganas, and David B. Haviland Applied Physics Letters 105, 143113 (2014); doi: 10.1063/1.4897966 Borgani_2012
[Borgani-2017]Background force compensation in dynamic atomic force microscopy. Riccardo Borgani, Per-Anders Thorén, Daniel Forchheimer, Illia Dobryden, Si Mohamed Sah, Per Martin Claesson, David B. Haviland Borgani_2017
[Forchheimer-2012]Model-based extraction of material properties in multifrequency atomic force microscopy. Daniel Forchheimer, Daniel Platz, Erik A. Tholén, and David B. Haviland. Phys. Rev. B. 85, 195449 (2012). Forchheimer_2012
[Forchheimer-2013]Simultaneous imaging of surface and magnetic forces. Daniel Forchheimer, Daniel Platz, Erik A. Tholén and David B. Haviland. Appl. Phys. Lett. 103, 013114 (2013) Forchheier_2013
[Green-2002]Torsional frequency response of cantilever beams immersed in viscous fluids with applications to the atomic force microscope. Christopher P. Green and John E. Sader Jour. Appl. Phys. 92, 6262 (2002).
[Haviland-2016]Quantitative force microscopy from a dynamic point of view. David B. Haviland Current Opinion in Colloid & Interface Science 27 74–81 (2016). Haviland_2016
[Higgins-2006]Noninvasive determination of optical lever sensitivity in atomic force microscopy. M. J. Higgins, R. Proksch, J. E. Sader, M. Polcik, S. Mc Endoo, J. P. Cleveland and S. P. Jarvis. Rev. Sci. Instr. 77, 013701 (2006).
[Hutter-2010]Reconstructing Nonlinearities with Intermodulation Spectroscopy. C. Hutter, D. Platz, E. A. Tholén , T. H. Hansson and D. B. Haviland. Phys. Rev. Lett. 104, 050801 (2010). Hutter_2010
[Platz-2008]Intermodulation atomic force microscopy. D. Platz, E. A. Tholén, D. Pessen and D. B. Haviland. Appl. Phys. Lett. 92, 153106 (2008). Platz_2008
[Platz-2012a]The role of nonlinear dynamics in quantitative atomic force microscopy. D. Platz, D. Forchheimer, E. A. Tholén and D. B. Haviland. Nanotechnology 23, 265705 (2012). Platz_2012a
[Platz-2012b]Interaction imaging with amplitude-dependence force spectroscopy. Daniel Platz, Daniel Forchheimer, Erik A. Tholén and David B. Haviland. Nature Commu. 4, 1360 (2012). doi:10.1038/ncoms2365 Platz_2012b
[Platz-2013a]Interpreting force and motion for narrow-band intermodulation atomic force microscopy. Daniel Platz, Daniel Forchheimer, Erik A. Tholén and David B. Haviland. Beilstein J. Nanotechnol. 4, 45 (2013). Platz_2013a
[Platz-2013b]Polynomial force approximations and multifrequency atomic force microscopy. Daniel Platz, Daniel Forchheimer, Erik A. Tholén and David B. Haviland. Beilstein J. Nanotechnol. 4, 352 (2013). Platz_2013b
[Sader-1998]Frequency response of cantilever beams immersed in viscous fluids with applications to the atomic force microscope. J. E. Sader. Jour. Appl. Phys. 84, 64 (1998).
[Sader-2005]General scaling law for stiffness measurement of small bodies with applications to the atomic force microscope. J. E. Sader et al. Jour. Appl. Phys. 97, 124903 (2005).
[Sader-2012]Spring constant calibration of atomic force microscope cantilevers of arbitrary shape. J. E. Sader et al. Rev. Sci Instr. 83 103705 (2012).
[Tholen-2011]The intermodulation lockin analyzer. E. A. Tholen, D. Platz, D. Forchheimer, V. Schuler, M. O. Tholén, C. Hutter and D. B. Haviland. Rev. Sci. Instr. 82, 026109 (2011). Tholen_2011
[Thoren-2017]Calibrating torsional eigenmodes of micro cantilevers for dynamic measurement of frictional forces. P.-A. Thorén et al. to be published 2017